CHARACTERIZATION OF VOLUME GRATINGS BASED ON DISTRIBUTED DIELECTRIC CONSTANT MODEL USING MUELLER MATRIX ELLIPSOMETRY

Characterization of Volume Gratings Based on Distributed Dielectric Constant Model Using Mueller Matrix Ellipsometry

Volume grating is a key optical component due to its comprehensive applications.Other than the common grating structures, volume grating is essentially a predesigned refractive Wall Hanging Kits index distribution recorded in materials, which raises the challenges of metrology.Although we have demonstrated the potential application of ellipsometry

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